The XDAL-PCB’s silicon drift detector (SDD) helps create the ideal measuring conditions for testing ENIG and ENEPIG coatings. It features a manually extractable stage for printed circuit boards up to 610×610 mm, a tungsten or chrome microfocus tube, 4x changeable aperture, 3x changeable filter, and uses the Fischer-patented DCM method for easy adjustment of the measuring distance.