The FISCHERSCOPE® X-RAY XDV®-µ PCB features a highly sensitive silicon drift detector (SDD) and polycapillary optics for precise measurements on structures less than 50 µm in size.
Using the XDV-µ PCB’s image recognition software, you can select and store a section of an image for use as a target for corresponding structures to be measured, thus eliminating the need to select each measuring position individually. The XDV-µ PCB features a programmable measuring stage, 4x changeable aperture, 4x changeable filter, and capillary optics for very small measuring of approximately 20 or 10 µm.