The FISCHERSCOPE® X-RAY XDV®-µ LD is the industry-leading XRF instrument for connector and electronics applications. The unique 12 mm measurement distance enables measuring complex shaped test parts such as assembled PCBs with a height of 140 mm.
Realize the smallest measurement points with excellent stability and high intensity. A large-area silicon drift detector, the Long Distance high-performance capillary and the digital pulse processor DPP+ integrated as standard allow precise, repeatable measurements with high count rates and short measuring times.