This XRF spectrometer is equipped with a particularly sensitive silicon drift detector (SDD) for testing very thin coatings in the electronics and semiconductor industries – e.g. gold and palladium layers less than 50 nm thick – in a non-destructive process. Analysis and authenticity testing of gold and other precious metals, and trace analysis of hazardous substances such as lead and cadmium according to RoHS, WEEE, CPSIA and other directives for electronics, packaging and consumer goods.