The COULOSCOPE® CMS2 instrument can measure the coating thicknesses of almost any metal layer by using the coulometric method, which allows for measuring greater thicknesses than X-ray fluorescence.
The coulometric method is a cost-effective, precise alternative to the X-ray fluorescence method – provided you can accept a destructive method for coating thickness measurement. It offers you maximum flexibility, as it can be used for a wide range of coating-carrier combinations.